DocumentCode
2174400
Title
Testing fully differential amplifiers using common mode feedback circuit: A case study
Author
Bender, Isis D. ; Cardoso, Guilherme S. ; de Oliveira, Arthur C. ; Severo, Lucas C. ; Girardi, Alessandro ; Balen, Tiago R.
Author_Institution
UFRGS - PGMICRO - Porto Alegre, RS, Brazil
fYear
2015
fDate
24-27 Feb. 2015
Firstpage
1
Lastpage
4
Abstract
This paper presents a simple and low-cost test methodology applied to fully differential amplifiers (FDAs). This kind of amplifier needs a common mode feedback (CMFB) circuit to keep the output common mode tightly controlled. In this work we propose the reuse of the CMFB circuit of FDAs as an embedded checker to ease the test of the whole amplifier, increasing the observability of faults occurring either in the amplifier or in the CMFB block. Catastrophic faults are injected into these two circuits by means of SPICE simulations, considering a 0.18µm FDA as case study. Transient and DC (Direct Current) tests are performed and the fault coverage is evaluated. Simulation results point to high fault coverage, while only the common mode feedback signal needs to be monitored. This way, a low-cost and low area overhead test methodology is achieved with affordable test time.
Keywords
Circuit faults; Differential amplifiers; Integrated circuit modeling; Logic gates; Testing; Transient analysis; Transient response;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits & Systems (LASCAS), 2015 IEEE 6th Latin American Symposium on
Conference_Location
Montevideo, Uruguay
Type
conf
DOI
10.1109/LASCAS.2015.7250488
Filename
7250488
Link To Document