DocumentCode :
2174401
Title :
Circuit model simulation for separate absorption, grading and multiplication avalance photodiodes (SAGM-APD) considering gradual changes of the electric field in active region
Author :
Abbasi, M.R. ; Sheikhi, M.H. ; Zarifkar, A.
Author_Institution :
Dept. of Electr. Eng., Shiraz Univ., Shiraz
fYear :
2007
fDate :
20-22 Dec. 2007
Firstpage :
862
Lastpage :
868
Abstract :
In this paper, we obtain a circuit model for separate absorption, grading and multiplication avalanche photodiodes (SAGM-APD). In this circuit modelling we consider the gradual changes of electric field in active region using split- step method . This circuit model is based on the carrier rate equations in the different regions of the device. Using the model we obtain the quantum efficiency and dark current. As examples, InP/InGaAsP/InGaAs SAGM-APD is simulated. There is a good agreement between the simulation and experimental results.
Keywords :
III-V semiconductors; arsenic compounds; avalanche photodiodes; circuit simulation; gallium arsenide; gallium compounds; indium compounds; InP-InGaAsP-InGaAs; carrier rate equations; circuit model simulation; dark current; quantum efficiency; separate absorption grading-and-multiplication avalanche photodiodes; split-step method; Avalanche Photodiode; Circuit Model; Rate Equation; Split-step Method; grading layer;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Information and Communication Technology in Electrical Sciences (ICTES 2007), 2007. ICTES. IET-UK International Conference on
Conference_Location :
Tamil Nadu
ISSN :
0537-9989
Type :
conf
Filename :
4735916
Link To Document :
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