Title :
Cyclostationary noise analysis of large RF circuits with multi-tone excitations
Author :
Roychowdhury, Jaijeet ; Long, David ; Feldmann, Peter
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
Abstract :
This paper introduces a new, efficient technique for analyzing RF noise in large circuits subjected to true multitone excitations. Noise statistics in such circuits are time-varying and are modelled in this work as cyclostationary stochastic processes, characterized in terms of their harmonic power spectral densities (HPSDs). Results from a large RF integrated circuit driven by an LO tone and a strong RF signal are presented. The analysis predicts correctly that the presence of the RF tone affects the noise significantly
Keywords :
UHF circuits; UHF integrated circuits; circuit analysis computing; circuit noise; frequency-domain analysis; integrated circuit noise; nonlinear network analysis; stochastic processes; RF integrated circuit; RF noise; RF tone; cyclostationary noise analysis; cyclostationary stochastic processes; harmonic power spectral densities; large RF circuits; multi-tone excitations; noise statistics; nonlinear circuits; 1f noise; Algorithm design and analysis; Band pass filters; Circuit analysis; Circuit noise; Noise generators; Radio frequency; Semiconductor device noise; Statistics; Stochastic processes;
Conference_Titel :
Custom Integrated Circuits Conference, 1997., Proceedings of the IEEE 1997
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-3669-0
DOI :
10.1109/CICC.1997.606652
