Cyclostationary noise analysis of large RF circuits with multi-tone excitations

Author

Roychowdhury, Jaijeet ; Long, David ; Feldmann, Peter

Author_Institution

AT&T Bell Labs., Murray Hill, NJ, USA

fYear

1997

fDate

5-8 May 1997

Firstpage

383

Lastpage

386

Abstract

This paper introduces a new, efficient technique for analyzing RF noise in large circuits subjected to true multitone excitations. Noise statistics in such circuits are time-varying and are modelled in this work as cyclostationary stochastic processes, characterized in terms of their harmonic power spectral densities (HPSDs). Results from a large RF integrated circuit driven by an LO tone and a strong RF signal are presented. The analysis predicts correctly that the presence of the RF tone affects the noise significantly

Keywords

UHF circuits; UHF integrated circuits; circuit analysis computing; circuit noise; frequency-domain analysis; integrated circuit noise; nonlinear network analysis; stochastic processes; RF integrated circuit; RF noise; RF tone; cyclostationary noise analysis; cyclostationary stochastic processes; harmonic power spectral densities; large RF circuits; multi-tone excitations; noise statistics; nonlinear circuits; 1f noise; Algorithm design and analysis; Band pass filters; Circuit analysis; Circuit noise; Noise generators; Radio frequency; Semiconductor device noise; Statistics; Stochastic processes;

fLanguage

English

Publisher

ieee

Conference_Titel

Custom Integrated Circuits Conference, 1997., Proceedings of the IEEE 1997

Conference_Location

Santa Clara, CA

Print_ISBN

0-7803-3669-0

Type

conf

DOI

10.1109/CICC.1997.606652

Filename

606652