• DocumentCode
    2174491
  • Title

    Metastability of SOI CMOS latches

  • Author

    Tretz, C. ; Chuang, C.T. ; Terman, L.M. ; Anderson, C.J. ; Zukowski, C.

  • Author_Institution
    Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
  • fYear
    1997
  • fDate
    6-9 Oct 1997
  • Firstpage
    162
  • Lastpage
    163
  • Abstract
    SOI has recently emerged as a serious contender for low-power high-performance applications. This paper examines the metastability of CMOS latches based on partially-depleted (PD) SOI devices with various body-connection topologies
  • Keywords
    CMOS logic circuits; circuit stability; flip-flops; silicon-on-insulator; SOI CMOS latch; body-connection topology; low-power circuit; metastability; partially-depleted SOI device; Clamps; Clocks; Diodes; MOSFET circuits; Metastasis; Power supplies; Rails; Switches; Topology; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference, 1997. Proceedings., 1997 IEEE International
  • Conference_Location
    Fish Camp, CA
  • ISSN
    1078-621X
  • Print_ISBN
    0-7803-3938-X
  • Type

    conf

  • DOI
    10.1109/SOI.1997.634983
  • Filename
    634983
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2174491