DocumentCode :
2174629
Title :
Study of micro-scale limits of solder self-assembly for MEMS
Author :
Harsh, K.F. ; Bright, V.M. ; Lee, Y.C.
Author_Institution :
Dept. of Mech. Eng., Colorado Univ., Boulder, CO, USA
fYear :
2000
fDate :
2000
Firstpage :
1690
Lastpage :
1695
Abstract :
Solder self-assembly of MEMS has been shown to be an excellent approach for assembling three-dimensional MEMS structures by allowing more precise alignments and vastly increased complexity. This paper investigates if solder self-assembly could be applied at the sub-micron scale. Experiments studying the surface energy minimization properties of molten solder demonstrate that surface energy minimized solder spheres as small as 5 nm are possible. However, the intermetallic formation may limit our ability to reach the nano-scales. Nevertheless, even with intermetallic formation, it should be possible to use solder self-assembly at sub micron scale
Keywords :
micromechanical devices; self-assembly; soldering; surface energy; MEMS; intermetallic compound formation; solder self-assembly; surface energy minimization; three-dimensional structure; Assembly; Chemical technology; Electronic packaging thermal management; Electronics packaging; Intermetallic; Manufacturing; Microelectromechanical devices; Micromechanical devices; Self-assembly; Surface tension;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-5908-9
Type :
conf
DOI :
10.1109/ECTC.2000.853447
Filename :
853447
Link To Document :
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