DocumentCode
2174649
Title
Package routability- and IR-drop-aware finger/pad assignment in chip-package co-design
Author
Lu, Chao-Hung ; Chen, Hung-Ming ; Liu, Chien-Nan Jimmy ; Shih, Wen-Yu
Author_Institution
Dept. of Electr. Eng., Nat. Central Univ., Taoyuan
fYear
2009
fDate
20-24 April 2009
Firstpage
845
Lastpage
850
Abstract
Due to increasing complexity of design interactions between the chip, package and PCB, it is essential to consider them at the same time. Specifically the finger/pad locations affect the performance of the chip and the package significantly. In this paper, we have developed techniques in chip-package codesign to decide the locations of fingers/pads for package routability and signal integrity concerns in chip core design. Our finger/pad assignment is a two-step method: first we optimize the wire congestion problem in package routing, and then we try to minimize the IR-drop violation with finger/pad solution refinement. The experimental results are encouraging. Compared with the randomly optimized methods, our approaches reduce in average 42% and 68% of the maximum density in package and 10.61% of IR-drop for test circuits.
Keywords
chip scale packaging; integrated circuit design; integrated circuit testing; printed circuits; IR-drop-aware finger-pad assignment; PCB; chip core design; chip-package co-design; finger-pad location; finger-pad solution refinement; package routability; signal integrity; Chaos; Chip scale packaging; Circuit testing; Design engineering; Electronics packaging; Fingers; Flowcharts; Noise reduction; Optimization methods; Routing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location
Nice
ISSN
1530-1591
Print_ISBN
978-1-4244-3781-8
Type
conf
DOI
10.1109/DATE.2009.5090780
Filename
5090780
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