Title :
A multi-pass A/D conversion technique for extracting on-chip analog signals
Author :
Hajjar, Ara ; Roberts, Gordon W.
Author_Institution :
Lab. of Microelectron. & Comput. Syst., McGill Univ., Montreal, Que., Canada
fDate :
31 May-3 Jun 1998
Abstract :
A high speed and area-efficient A/D convertor is proposed for mixed-signal test applications. Only a single on-chip comparator is required to digitize repetitive analog waveforms. Simulations show 10 bits of amplitude resolution at 300 MHz for a bipolar comparator design (0.8 μm BiCMOS process), and 10 bits of amplitude resolution at 667 MHz for a CMOS comparator design (0.5 μm CMOS process)
Keywords :
BiCMOS integrated circuits; CMOS integrated circuits; analogue-digital conversion; comparators (circuits); design for testability; integrated circuit testing; mixed analogue-digital integrated circuits; 0.5 micron; 0.8 micron; 300 MHz; 667 MHz; A/D conversion technique; BiCMOS process; CMOS comparator design; DFT; amplitude resolution; bipolar comparator design; high speed ADC; mixed-signal test applications; multi-pass ADC; onchip analog signals extraction; onchip comparator; repetitive analog waveforms; CMOS process; Circuit testing; Converters; Integrated circuit testing; Microelectronics; Mixed analog digital integrated circuits; Process design; Sampling methods; Signal resolution; Timing;
Conference_Titel :
Circuits and Systems, 1998. ISCAS '98. Proceedings of the 1998 IEEE International Symposium on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-4455-3
DOI :
10.1109/ISCAS.1998.706910
