Arbitrary band-limited pulse generation for built-in self-test applications

Author

Dufort, Benoit ; Roberts, Gordon W.

Author_Institution

Lab. of Microelectron. & Comput. Syst., McGill Univ., Montreal, Que., Canada

Volume

2

fYear

1998

fDate

31 May-3 Jun 1998

Firstpage

284

Abstract

This paper describes a new technique to generate a variety of arbitrary band-limited pulse shapes that can be used efficiently in built-in self-test applications. The proposed method requires very little area and the same hardware can be used to generate pulses of different shapes. This is particularly useful in testing receivers with different pulse shapes coming from the transmission medium such as a twisted pair cable. Experimental results from an on-chip CMOS generator are also be given

Keywords

analogue integrated circuits; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; pulse generators; BIST applications; arbitrary band-limited pulse shapes; band-limited pulse generation; built-in self-test applications; onchip CMOS generator; receiver testing; Bandwidth; Built-in self-test; Circuit testing; Filters; Integrated circuit testing; Pulse generation; Pulse modulation; Pulse shaping methods; Signal generators; Transfer functions;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1998. ISCAS '98. Proceedings of the 1998 IEEE International Symposium on

Conference_Location

Monterey, CA

Print_ISBN

0-7803-4455-3

Type

conf

DOI

10.1109/ISCAS.1998.706911

Filename

706911