• DocumentCode
    2175196
  • Title

    Hardware/software co-design architecture for thermal management of chip multiprocessors

  • Author

    Khan, Omer ; Kundu, Sandip

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Massachusetts, Amherst, MA, USA
  • fYear
    2009
  • fDate
    20-24 April 2009
  • Firstpage
    952
  • Lastpage
    957
  • Abstract
    The sustained push for performance, transistor count, and instruction level parallelism has reached a point where chip level power density issues are at the forefront of design constraints. Many high performance computing platforms are integrating several homogeneous or heterogeneous processing cores on the same die to fit small form factors. Due to the design limitations of using expensive cooling solutions, such complex chip multiprocessors require an architectural solution to mitigate thermal problems. Many of the current systems deploy Dynamic Voltage and Frequency Scaling (DVFS) to address thermal emergencies, either within the Operating System or hardware. These techniques have certain limitations in terms of response lag, scalability, cost and being reactive. In this paper, we present an alternative thermal management system to address these limitations, based on hardware/software co-design architecture. The results show that in the 65 nm technology, a predictive, targeted, and localized response to thermal events improves a quad-core performance by an average of 50% over conventional chip-level DVFS.
  • Keywords
    hardware-software codesign; microprocessor chips; operating systems (computers); thermal management (packaging); chip multiprocessors; dynamic voltage-and-frequency scaling; hardware-software codesign architecture; operating system; quad-core performance; response lag; size 65 nm; thermal emergencies; thermal management; transistor count; Computer architecture; Cooling; Dynamic voltage scaling; Frequency; Hardware; High performance computing; Operating systems; Parallel processing; Scalability; Thermal management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
  • Conference_Location
    Nice
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-3781-8
  • Type

    conf

  • DOI
    10.1109/DATE.2009.5090802
  • Filename
    5090802