• DocumentCode
    2175253
  • Title

    Investigation of Transient Fault Effects in an Asynchronous NoC Router

  • Author

    Yaghini, Pooria M. ; Eghbal, Ashkan ; Pedram, H. ; Zarandi, H.R.

  • Author_Institution
    Dept. of Comput. Eng. & Inf. Technol., Amirkabir Univ. of Technol., Tehran, Iran
  • fYear
    2010
  • fDate
    17-19 Feb. 2010
  • Firstpage
    540
  • Lastpage
    545
  • Abstract
    This paper presents Investigation of Transient Fault Effects in an asynchronous NoC router. The experiment is based on simulation-based fault injection method to assess the fault-tolerant behavior of the asynchronous router. The effort has been accomplished by employing fault injector signal (FIS) in 136 targets. 13600 transient and permanent faults have been injected into the CSP-Verilog model of NoC router. Different fault models such as glitch, cross-talk, SEU, and SET have been applied in this effort to evaluate asynchronous NoC Router. The experimental results have been considered in different aspects to estimate the NoC router´s robustness. Although asynchronous designs seem inherently fault-tolerant due to applying handshaking signals, up to 56% of the injected faults result in failure, and about 43% of injected faults are overwritten before turning into errors. Less than 1% of injected faults treat as latent error. Moreover, the failure rate of token generation consumption is higher than token consumption effects.
  • Keywords
    fault tolerance; network routing; network-on-chip; transient analysis; CSP-Verilog model; asynchronous NoC router; fault injector signal; fault-tolerant behavior; simulation-based fault injection method; transient fault effects; Crosstalk; Delay; Electromagnetic interference; Electromagnetic radiation; Fault tolerance; Network-on-a-chip; Redundancy; Robustness; Routing; Single event upset; Asynchronous; Fault Tolerance; NoC;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Parallel, Distributed and Network-Based Processing (PDP), 2010 18th Euromicro International Conference on
  • Conference_Location
    Pisa
  • ISSN
    1066-6192
  • Print_ISBN
    978-1-4244-5672-7
  • Electronic_ISBN
    1066-6192
  • Type

    conf

  • DOI
    10.1109/PDP.2010.21
  • Filename
    5452472