DocumentCode
2175407
Title
Neural solution to multitarget tracking in clutter with velocity measurements
Author
Yu, Wei ; Mao, Shiyi ; Lin, Pinxing ; Li, Shaohong
Author_Institution
Dept. of Electron. Eng., Beijing Univ. of Aeronaut. & Astronaut., China
fYear
1994
fDate
23-27 May 1994
Firstpage
204
Abstract
The problem of tracking multitarget in clutter environment in a track while scan (TWS) system is considered. In such an environment, missed detections and false alarms make it impossible to decide, with certainty, the origin of received report. The two main functions of the TWS algorithm are : 1) plot-to-track (state predicted estimate) association, and 2) the filtering algorithm that uses the associated plot for recursive estimation. In this paper, ANN (artificial-neural-network based data association method approximate to NNPDA (nearest neighbour probabilistic data association) is used to realize plot-to-track association, while filtering algorithm suitable to tracking with radial velocity measurements is introduced. Simulation results included in this paper show a great improvement of tracking performance when radial velocity measurements are used
Keywords
data analysis; digital simulation; filtering and prediction theory; neural nets; radar clutter; state estimation; tracking; velocity measurement; artificial-neural-network; associated plot; clutter; data association method; false alarms; filtering algorithm; missed detections; multitarget tracking; nearest neighbour probabilistic data association; neural solution; plot-to-track; plot-to-track association; radial velocity measurement; recursive estimation; simulation results; state predicted estimate; track while scan system; velocity measurement; Artificial neural networks; Clutter; Extraterrestrial measurements; Filtering algorithms; Filters; Personal digital assistants; Radar tracking; Recursive estimation; Target tracking; Velocity measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace and Electronics Conference, 1994. NAECON 1994., Proceedings of the IEEE 1994 National
Conference_Location
Dayton, OH
Print_ISBN
0-7803-1893-5
Type
conf
DOI
10.1109/NAECON.1994.332876
Filename
332876
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