DocumentCode
2175472
Title
Characterization of cross-plane thermoelectric properties of Si/Ge superlattices
Author
Bao Yang ; Liu, Jianlin ; Wang, Kang ; Chen, Gang
Author_Institution
Dept. of Mech. & Aerosp. Eng., California Univ., Los Angeles, CA, USA
fYear
2001
fDate
2001
Firstpage
344
Lastpage
347
Abstract
In this paper, a novel method is developed to measure simultaneously the Seebeck coefficient and thermal conductivity in the cross-plane direction of thin films. Using a differential measurement between a superlattice sample and a reference sample, the temperature and voltage drops cross the superlattice thin film are determined and used to deduce its cross plane thermal conductivity and Seebeck coefficient
Keywords
Seebeck effect; elemental semiconductors; germanium; semiconductor superlattices; silicon; thermal conductivity; thermoelectricity; Seebeck coefficient; Si-Ge; Si/Ge superlattices; cross-plane thermoelectric properties; thermal conductivity; Conductivity measurement; Electrons; Frequency; Laser sintering; Phonons; Semiconductor superlattices; Thermal conductivity; Thermoelectricity; Transistors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermoelectrics, 2001. Proceedings ICT 2001. XX International Conference on
Conference_Location
Beijing
ISSN
1094-2734
Print_ISBN
0-7803-7205-0
Type
conf
DOI
10.1109/ICT.2001.979902
Filename
979902
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