DocumentCode :
2175545
Title :
Cross-range scaling of inverse synthetic aperture radar
Author :
She, Zhishun ; Zhu, Zhaoda
Author_Institution :
Dept. of Electron. Eng., Nanjing Univ. of Aeronaut. & Astronaut., China
fYear :
1994
fDate :
23-27 May 1994
Firstpage :
175
Abstract :
This paper investigates the problem of cross-range scaling of inverse synthetic aperture radar. It is very important to target classification and recognition via ISAR. The cross-range scale of ISAR depends on both radar wavelength and rotating angle of target relative to radar-line-of-sight (RLOS) during the total coherent processing time. The former is known while the latter is difficult to determine especially in the case of ISAR. In this paper, a new approach, which is based on the principle of tomographic imaging and the property of the coherent processing of echo data, is developed to estimate the rotating angle of target relative to RLOS during the total coherent processing time. As such,it is able to carry out the cross-range scaling of ISAR. The proposed approach is used to process the computer simulated data and the real data of model B-52 collected in a microwave anechoic chamber. The processing results show that the proposed approach is correct and effective
Keywords :
digital simulation; image reconstruction; microwave imaging; pattern recognition; radar applications; synthetic aperture radar; ISAR; coherent processing; coherent processing time; computer simulated data; cross-range scale; cross-range scaling; echo data; inverse synthetic aperture radar; microwave anechoic chamber; model B-52; radar wavelength; radar-line-of-sight; rotating angle; target classification; target recognition; tomographic image; tomographic imaging; Anechoic chambers; Computational modeling; Computer simulation; Inverse synthetic aperture radar; Radar imaging; Shape; Signal resolution; Spaceborne radar; Target recognition; Tomography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace and Electronics Conference, 1994. NAECON 1994., Proceedings of the IEEE 1994 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-1893-5
Type :
conf
DOI :
10.1109/NAECON.1994.332881
Filename :
332881
Link To Document :
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