DocumentCode
2175593
Title
Measurement of Two-Dimensional Small Angles Based on Interference Fringes
Author
Wang, Xuanze ; Cao, Hongduan ; Zhai, Zhongsheng
Author_Institution
Sch. of Mech. Eng., HuBei Univ. of Technol., Wuhan, China
fYear
2009
fDate
17-19 Oct. 2009
Firstpage
1
Lastpage
5
Abstract
A novel two-dimensional small angles measurement is introduced, which is based on the relation between the interference fringes shape (direction and width) and the angle contained by two lights of Michelson interferometer, and utilizes quadrant Si-photoelectric detector (QPD) as detection device. The status of interference fringes changes from static to dynamic, with modulating the wavelength of the laser-diode (LD) by sawtooth modulation. To ensure that while LD is shining, the change of the wavelength of the LD is linear, this paper adopted sawtooth modulation signal (500 Hz) with a DC offset. Using High Speed A/D Convert Card (250 K) and software to collect analogue signal, and data processing technique to got the swing angle. The test precision is 0.05"calculated by experiment data.
Keywords
Michelson interferometers; angular measurement; interference (signal); photoelectric devices; semiconductor lasers; waveform generators; 2D small angles measurement; DC offset; Michelson interferometer; data processing; frequency 500 Hz; high speed A/D convert card; interference fringes; laser-diode sawtooth modulation; quadrant photoelectric detector; static to dynamic; swing angle; Goniometers; Interference; Mechanical variables measurement; Mirrors; Optical interferometry; Optical reflection; Ring lasers; Shape measurement; Spectroscopy; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Image and Signal Processing, 2009. CISP '09. 2nd International Congress on
Conference_Location
Tianjin
Print_ISBN
978-1-4244-4129-7
Electronic_ISBN
978-1-4244-4131-0
Type
conf
DOI
10.1109/CISP.2009.5304842
Filename
5304842
Link To Document