DocumentCode :
2175604
Title :
Cross-coupling in 65nm fully integrated EDGE System On Chip Design and cross-coupling prevention of complex 65nm SoC
Author :
Bonnaud, Pierre-Henri ; Sommer, Grit
Author_Institution :
Mobile Phone Platform, Infineon Technol., Sophia-Antipolis
fYear :
2009
fDate :
20-24 April 2009
Firstpage :
1045
Lastpage :
1050
Abstract :
Entry mobile phone market is a mass volume segment where the modem and application technologies are commoditized and fully proven. Nevertheless the cost and power reduction target continues to heavily drive leading edge innovations. Semiconductor companies strive to integrate more and more Printed Circuit Board (PCB) components into one single chip, without discontinuing the technology node shrink roadmap, from 130 nm down to 65 nm. This duality between integration level and aggressive silicon feature size reduction generates an innovative environment where design engineers must create new methodologies to cope with complex cross coupling mechanisms and additional power dissipation. This paper describes one aspect of the design methodology to reduce the die and package cross-talks, and focus on the package co-design flow. The chip being considered is a 65 nm single chip System on Chip (SoC) including EDGE RF, Power Management Unit (PMU), Audio Front End (AFE) and FM Radio (FMR) circuits.
Keywords :
chip scale packaging; crosstalk; frequency modulation; mobile radio; printed circuit manufacture; radio networks; radiofrequency integrated circuits; system-on-chip; EDGE RF circuits; FM radio circuits; aggressive silicon feature size reduction; audio front end circuit; cross-coupling; die; integration level; package cross-talks; power management unit; printed circuit board; single chip system-on-chip; size 65 nm; Costs; Integrated circuit technology; Mobile handsets; Modems; Packaging; Power generation; Printed circuits; Silicon; System-on-a-chip; Technological innovation; Chip&Package Co-Design; SoC integration; aggressors; cross-coupling; eWLB; victims;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location :
Nice
ISSN :
1530-1591
Print_ISBN :
978-1-4244-3781-8
Type :
conf
DOI :
10.1109/DATE.2009.5090818
Filename :
5090818
Link To Document :
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