Title :
Approaches to Seebeck coefficient by ab initio calculation using molecular orbital method
Author :
Katanahara, H. ; Sugihara, S. ; Isobe, T.
Author_Institution :
Mater. Res. Lab., Pennsylvania State Univ., University Park, PA, USA
Abstract :
The β-phase FeSi2 semiconductor has a high Seebeck coefficient and high oxidation resistance at high temperature, low cost and ecological adaptability as well. We analyzed the characteristics of β-FeSi2 thermoelectric material from the electronic structure with the DV-Xα method. We put the Fe and Si atoms of the β-FeSi2 at the actual positions and also simulated p-type and n-type semiconductors. We found the donor or acceptor level in the energy gap by substituting a metal for the Fe atom. The impurity atom creates the donor or acceptor level. We made a hypothesis that the Seebeck coefficient depends on the energy gap and the orbital structures. The purpose of our study is to discuss and elucidate the electron transferring HOMO (Highest Occupied Molecular Orbital) to donor level or LUMO (Lowest Unoccupied Molecular Orbital) to accepter level in the energy gap. And also we found the Seebeck coefficients are 133 μ V/K and 200μ V/K on Mn-added and Co-added FeSi2 from the energy gap respectively
Keywords :
Seebeck effect; Xalpha calculations; ab initio calculations; band structure; cobalt; energy gap; impurity states; iron compounds; manganese; orbital calculations; semiconductor materials; β-phase FeSi2 semiconductor; Co; DV-Xα method; FeSi2:Mn,Co; HOMO; Highest Occupied Molecular Orbital; LUMO; Lowest Unoccupied Molecular Orbital; Mn; Seebeck coefficient; ab initio calculation; acceptor level; donor level; ecological adaptability; electronic structure; energy gap; high oxidation resistance; high temperature; impurity atom; low cost; molecular orbital method; n-type semiconductors; orbital structures; p-type semiconductors; thermoelectric material; Atomic layer deposition; Ceramics; Computer simulation; Electrons; Energy states; Iron; Materials science and technology; Orbital calculations; Semiconductor materials; Thermoelectricity;
Conference_Titel :
Thermoelectrics, 2001. Proceedings ICT 2001. XX International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-7205-0
DOI :
10.1109/ICT.2001.979912