Title :
Chip-package-board co-design - a DDR3 system design example from circuit designers’ perspective
Author :
Lin, Yu-Hsiang ; Chou, Jonathan ; Lu, Yi-Chang ; Wu, Tzong-Lin ; Chen, Hsin-Shu
Author_Institution :
Grad. Inst. of Electron. Eng. & Grad. Inst. of Commun. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
If package and board level parasitic models are not correctly included, as in many conventional design flows, the simulation results could be too optimistic as the impact from power and signal integrity (PI/SI) is underestimated. In addition, the process and temperature variations could further decrease design margins. In this paper, a detailed chip-package-board (CPB) parasitic model is applied at different process and temperature corners to investigate how PI/SI impacts input/output (I/O) performance of a 1.6-Gbps DDR3 memory system with the supply voltage at 1.5 V, where eye-opening (heye) is the major performance index number. The simulation results indicate that heye may differ as high as 58% if CPB parasitics are not properly modelled, where the issues would be more significant as I/O data rate increases to multi-gigabit-per-second.
Keywords :
DRAM chips; chip-on-board packaging; input-output programs; DDR3 memory system; I/O data rate; bit rate 1.6 Gbit/s; chip-package-board parasitic model; input-output performance; performance index number; power integrity; signal integrity; supply voltage; voltage 1.5 V; Capacitors; Circuit simulation; Design engineering; Distributed parameter circuits; Fluctuations; Packaging; Performance analysis; Power transmission lines; Temperature; Voltage;
Conference_Titel :
Advanced Packaging and Systems Symposium, 2008. EDAPS 2008. Electrical Design of
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-2633-1
Electronic_ISBN :
978-1-4244-2634-8
DOI :
10.1109/EDAPS.2008.4735990