Title :
In-circuit impedance measurement based on a two-probe approach
Author :
Weng-Yew Chang, R. ; See, Kye-Yak ; Bo, Hu
Author_Institution :
Guided Syst. Div., DSO Nat. Labs., Singapore, Singapore
Abstract :
Most impedance measurement instruments usually measure the impedance of a component or device under no-load condition. Therefore, any non-linear behaviour and other on-board circuit components or parasitic are not detected or taken into consideration. Based on a novel two-probe measurement technique, the impedance of any in-circuit component can be measured with ease. Using the resistor characterization as a preliminary study, the proposed technique is able to accurately determine the impedance of the in-circuit resistor at the intended operating condition up to 1 GHz.
Keywords :
electric impedance measurement; in-circuit component; in-circuit impedance measurement; nonlinear behaviour; on-board circuit components; two-probe measurement technique; Circuit testing; Coupling circuits; Current measurement; Distributed parameter circuits; Frequency; Impedance measurement; Measurement techniques; Probes; Resistors; Signal design;
Conference_Titel :
Advanced Packaging and Systems Symposium, 2008. EDAPS 2008. Electrical Design of
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-2633-1
Electronic_ISBN :
978-1-4244-2634-8
DOI :
10.1109/EDAPS.2008.4735992