• DocumentCode
    2176194
  • Title

    In-circuit impedance measurement based on a two-probe approach

  • Author

    Weng-Yew Chang, R. ; See, Kye-Yak ; Bo, Hu

  • Author_Institution
    Guided Syst. Div., DSO Nat. Labs., Singapore, Singapore
  • fYear
    2008
  • fDate
    10-12 Dec. 2008
  • Firstpage
    35
  • Lastpage
    38
  • Abstract
    Most impedance measurement instruments usually measure the impedance of a component or device under no-load condition. Therefore, any non-linear behaviour and other on-board circuit components or parasitic are not detected or taken into consideration. Based on a novel two-probe measurement technique, the impedance of any in-circuit component can be measured with ease. Using the resistor characterization as a preliminary study, the proposed technique is able to accurately determine the impedance of the in-circuit resistor at the intended operating condition up to 1 GHz.
  • Keywords
    electric impedance measurement; in-circuit component; in-circuit impedance measurement; nonlinear behaviour; on-board circuit components; two-probe measurement technique; Circuit testing; Coupling circuits; Current measurement; Distributed parameter circuits; Frequency; Impedance measurement; Measurement techniques; Probes; Resistors; Signal design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging and Systems Symposium, 2008. EDAPS 2008. Electrical Design of
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-2633-1
  • Electronic_ISBN
    978-1-4244-2634-8
  • Type

    conf

  • DOI
    10.1109/EDAPS.2008.4735992
  • Filename
    4735992