Title :
On the efficient reduction of complete EM based parametric models
Author :
Villena, Jorge Fernández ; Ciuprina, Gabriela ; Ioan, Daniel ; Silveira, Luis Miguel
Author_Institution :
INESC ID/IST, Tech. Univ. Lisbon, Lisbon
Abstract :
Due to higher integration and increasing frequency based effects, full electromagnetic models (EM) are needed for accurate prediction of the real behavior of integrated passives and interconnects. Furthermore, these structures are subject to parametric effects due to small variations of the geometric and physical properties of the inherent materials and manufacturing process. Accuracy requirements lead to huge models, which are expensive to simulate and this cost is increased when parameters and their effects are taken into account. This paper presents a complete procedure for efficient reduction of realistic, hierarchy aware, EM based parametric models. Knowledge of the structure of the problem is explicitly exploited using domain partitioning and novel electromagnetic connector modeling techniques to generate a hierarchical representation. This enables the efficient use of block parametric model order reduction techniques to generate block-wise compressed models that satisfy overall requirements, and provide accurate approximations of the complete EM behaviour, which are cheap to evaluate and simulate.
Keywords :
electric connectors; electromagnetic coupling; interconnections; EM based parametric models; block-wise compressed model; electromagnetic connector modeling techniques; electromagnetic field coupling; electromagnetic models; manufacturing process; Connectors; Electromagnetic coupling; Electromagnetic modeling; Integrated circuit modeling; Mathematical model; Maxwell equations; Parametric statistics; Predictive models; Process design; Radio frequency;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location :
Nice
Print_ISBN :
978-1-4244-3781-8
DOI :
10.1109/DATE.2009.5090840