Title :
Research and preparation of two-dimensional plane arrays thermal imaging sensor
Author :
Ye, Shuichi ; Zhang, Guowei ; Wang, Xilian ; Wang, Dajin ; Liu, Zhenmao
Author_Institution :
Dept. Electron. Sci. & Technol., Harbin Inst. of Technol., China
Abstract :
Infrared imaging systems have been applied widely, and developed step by step with improved performance of infrared image devices. Although a thermocouple prepared by high quality thermoelectric materials has already been used as thermoelectric detectors, it is of new exploration when used as units of two-dimensional plane array thermal imaging sensors. In this paper, the working principle, device design, manufacturing process, device performance and measurement of two-dimensional plane array sensors are introduced and given in detail. The prepared thermal imaging sensors with 10 × 10 pixels in 20 × 20 mm2 are made up of thermocouples with a single pixel of dimension of 0.4 × 0.4 × 0.15 mm3 and prepared by pseudo-ternary BiTe thermoelectric materials with figure of merits Z=3.09 × 10-3 K. The unit area for accepting thermal radiation is 1.9 × 1.9 mm2. The performance of the pixels and their uniformity in the arrays is measured respectively. From measurements, the maximum responsivity 0.12 V/W, detectability D* 1.17 × 10 Hz1/2/W and responsive-time 24 ms of the thermal image arrays are obtained. The experimental results and theoretical analyses were compared, based on which, new ways for improving two-dimensional plane arrays thermal imaging sensors are proposed in this paper
Keywords :
bismuth compounds; focal planes; image sensors; infrared imaging; optical arrays; semiconductor device measurement; semiconductor device models; semiconductor materials; thermocouples; 1.9 mm; 10 pixel; 100 pixel; 20 mm; 24 ms; BiTe; detectability; figure of merit; infrared imaging systems; manufacturing; pixels; preparation; pseudo-ternary BiTe thermoelectric materials; response-time; thermal radiation; thermocouple; two-dimensional plane array thermal imaging sensor; uniformity; Detectors; Image sensors; Infrared imaging; Manufacturing processes; Optical imaging; Pixel; Process design; Sensor arrays; Thermal sensors; Thermoelectricity;
Conference_Titel :
Thermoelectrics, 2001. Proceedings ICT 2001. XX International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-7205-0
DOI :
10.1109/ICT.2001.979937