• DocumentCode
    2176368
  • Title

    When good requirements turn bad

  • Author

    Nicholls, David ; Lein, P.

  • Author_Institution
    Reliability Inf. Anal. Center, Utica, NY, USA
  • fYear
    2013
  • fDate
    28-31 Jan. 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The root cause of the difference between predicted reliability during DoD system development and achieved reliability in OT&E is “bad” reliability requirements being placed on contract, or misinterpreted/misapplied during development. This paper has identified the need for a more accurate and comprehensive approach to developing contractual reliability requirements that meet the end-users´ operational reliability needs. A hypothetical example was provided that showed how good requirements can turn bad, and their general impact on reliability growth curve planning and reliability testing. A formal standard process was recommended that can be used to develop and allocate contractual reliability requirements that are based on all of the failure categories that ultimately impact whether a system will comply with its operational reliability requirements. Finally, a list of forward-looking recommendations was provided that, if implemented, would help ensure the success of the DoD acquisition process for acquiring reliable systems.
  • Keywords
    defence industry; failure analysis; reliability; DoD acquisition process; DoD system development; contractual reliability requirements; end user operational reliability needs; failure categories; failure symptoms; reliability growth curve planning; reliability testing; root failure cause; standard process; Contracts; Hardware; Reliability engineering; Software; Software reliability; US Department of Defense; Failure Category; Reliability Prediction; Reliability Requirements; System Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
  • Conference_Location
    Orlando, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4673-4709-9
  • Type

    conf

  • DOI
    10.1109/RAMS.2013.6517616
  • Filename
    6517616