DocumentCode :
2176503
Title :
Superior reliability prediction in design and development phase
Author :
Kanapady, R. ; Adib, R.
Author_Institution :
MSCWorks Inc., Campbell, CA, USA
fYear :
2013
fDate :
28-31 Jan. 2013
Firstpage :
1
Lastpage :
6
Abstract :
High demanded reliable components or systems projects necessitate reliability prediction in early design and development phase. Historically reliability predictions are performed using standardization of the technique such as MIL-HDBK-217 or similar handbook, which in many cases has produced inaccurate reliability results. Today´s complex designs, which have intricate interfaces and boundaries, cannot rely on these methods to predict reliability. This paper presents superior reliability prediction approach for design and development of projects that demands high reliability where traditional prediction approach has failed to do the job. The effectiveness of the proposed approach is illustrated with a suitable example of solder ball failures on a silicon chip and circuit board. Reliability of solder ball has been accurately predicted. Sensitivity analysis, which determines factors that can mitigate or eliminate the failure mode(s) has been performed. Probabilistic analysis such as the burden capability method is employed for assessing the probability of failure mode occurrences, which provides a structured approach to ranking of the failure modes, based on a combination of their probability of occurrence and severity of their effects. The effective number of simulation runs for various random variables and how to compute the life is also presented.
Keywords :
product design; product development; reliability; sensitivity analysis; statistical analysis; burden capability method; circuit board; failure mode occurrence; probabilistic analysis; project design phase; project development phase; sensitivity analysis; silicon chip; solder ball failure; solder ball reliability; superior reliability prediction approach; Load modeling; Materials; Predictive models; Reliability engineering; Sensitivity; Strain; BGA; Ball Grid Array; Modeling; Probabilistic; Reliability; Simulation; Solder joint; electronic devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
Conference_Location :
Orlando, FL
ISSN :
0149-144X
Print_ISBN :
978-1-4673-4709-9
Type :
conf
DOI :
10.1109/RAMS.2013.6517621
Filename :
6517621
Link To Document :
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