DocumentCode :
2176523
Title :
PCB embedded capacitor with central via connection structure for RF application
Author :
Chen, Chang-Sheng ; Lin, Yo-Shen ; Chen, Wei-Ting ; Shyu, Chin-Sun ; Lay, Shinn-Juh ; Lee, Min-Lin
Author_Institution :
Electron. & Opto-Electron. Res. Labs., Ind. Technol. Res. Inst., Hsinchu, Taiwan
fYear :
2008
fDate :
10-12 Dec. 2008
Firstpage :
77
Lastpage :
80
Abstract :
Although PCB embedded passives technology has been studied for several years, there are still many researches continuing to make it more complete and applicable. This work focus on the electrical performance of MIM (metal-insulator-metal) type embedded capacitor. For high frequency application, the self-resonance frequency (SRF) is an important design parameter. Different I/O connection types and positions on the electrode will change the parasitic effect and thus affect SRF. In this paper, an embedded capacitor with central via connection is utilized to enhance the SRF. Since the coupling effect from other nearby components also degrades the characteristic of embedded capacitor, a shielding structure for PCB embedded capacitor is designed to prevent the interference from internal high density routing and keep good electrical performance.
Keywords :
MIM devices; capacitors; electromagnetic shielding; passive networks; printed circuits; radiofrequency interference; I/O connection type; MIM electrical performance; PCB capacitor shielding structure; PCB embedded capacitor characteristics; PCB embedded passive technology; RF application; RF interference; coupling effect; high frequency application; internal high density routing; metal-insulator-metal type embedded capacitor; self-resonance frequency; Circuits; Dielectric materials; Electrodes; Industrial electronics; Laboratories; MIM capacitors; Packaging; Parasitic capacitance; Q factor; Radio frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Packaging and Systems Symposium, 2008. EDAPS 2008. Electrical Design of
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-2633-1
Electronic_ISBN :
978-1-4244-2634-8
Type :
conf
DOI :
10.1109/EDAPS.2008.4736003
Filename :
4736003
Link To Document :
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