• DocumentCode
    2176523
  • Title

    PCB embedded capacitor with central via connection structure for RF application

  • Author

    Chen, Chang-Sheng ; Lin, Yo-Shen ; Chen, Wei-Ting ; Shyu, Chin-Sun ; Lay, Shinn-Juh ; Lee, Min-Lin

  • Author_Institution
    Electron. & Opto-Electron. Res. Labs., Ind. Technol. Res. Inst., Hsinchu, Taiwan
  • fYear
    2008
  • fDate
    10-12 Dec. 2008
  • Firstpage
    77
  • Lastpage
    80
  • Abstract
    Although PCB embedded passives technology has been studied for several years, there are still many researches continuing to make it more complete and applicable. This work focus on the electrical performance of MIM (metal-insulator-metal) type embedded capacitor. For high frequency application, the self-resonance frequency (SRF) is an important design parameter. Different I/O connection types and positions on the electrode will change the parasitic effect and thus affect SRF. In this paper, an embedded capacitor with central via connection is utilized to enhance the SRF. Since the coupling effect from other nearby components also degrades the characteristic of embedded capacitor, a shielding structure for PCB embedded capacitor is designed to prevent the interference from internal high density routing and keep good electrical performance.
  • Keywords
    MIM devices; capacitors; electromagnetic shielding; passive networks; printed circuits; radiofrequency interference; I/O connection type; MIM electrical performance; PCB capacitor shielding structure; PCB embedded capacitor characteristics; PCB embedded passive technology; RF application; RF interference; coupling effect; high frequency application; internal high density routing; metal-insulator-metal type embedded capacitor; self-resonance frequency; Circuits; Dielectric materials; Electrodes; Industrial electronics; Laboratories; MIM capacitors; Packaging; Parasitic capacitance; Q factor; Radio frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging and Systems Symposium, 2008. EDAPS 2008. Electrical Design of
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-2633-1
  • Electronic_ISBN
    978-1-4244-2634-8
  • Type

    conf

  • DOI
    10.1109/EDAPS.2008.4736003
  • Filename
    4736003