DocumentCode :
2176608
Title :
High temperature stable contacts for thermoelectric sensors and devices
Author :
Ernst, H. ; Müller, E. ; Kaysser, W.A.
Author_Institution :
Inst. of Mater. Res., German Aerosp. Center (DLR), Koln, Germany
fYear :
2001
fDate :
2001
Firstpage :
521
Lastpage :
524
Abstract :
Thermoelectric materials and devices are used for energy conversion,, cooling and thermal sensors. Semiconductors like Si, Si1-xGex, SiC, β-FeSi2 are suitable as thermal sensor materials at elevated temperature due to their high thermopower and high temperature stability. Studying the electrical properties of semiconductors, as well as the normal operation of most semiconductor devices, requires the presence of non-rectifying metal-semiconductor contacts. High temperature stable ohmic contacts to these materials are necessary for good sensor performance and long term stability. Laser welding allows fast processing of thermally stable contacts to semiconductors and offers a convenient and reliable way to form electrical contacts for high temperature material characterization. Ohmic contacts to Si and FeSi2 were prepared by laser welding of thin tungsten studs and foils to the semiconductor. Thermocouple wires can be welded to such a tungsten interlayer for temperature measurement immediately at the semiconductor surface. Si-W contacts and FeSi2-W contacts show good thermal stability up to 450°C in air. For use at even higher temperatures tungsten must be protected against oxidation. Different oxidation protective layers were studied. To form ohmic contacts to moderately doped n-type SiC Ni-based alloys were used. The thermal stability of these contacts was investigated up to 750°C in air. The electrical characteristics (I-V interdependence and contact resistance) and the thermal stability of the contacts were investigated. Electron microscopy, EDX and XRD analyses were used to detect chemical reactions arising in the laser welding process and under thermal treatment
Keywords :
X-ray chemical analysis; X-ray diffraction; corrosion protective coatings; electric sensing devices; electron microscopy; heat treatment; high-temperature effects; infrared detectors; laser beam welding; ohmic contacts; oxidation; semiconductor-metal boundaries; surface chemistry; temperature measurement; thermal stability; thermocouples; thermoelectric devices; thermoelectric power; 450 C; 750 C; EDX; FeSi2; Ni-based alloys; Si; Si-W contacts; Si1-xGex; SiC; W; XRD; chemical reactions; contact resistance; cooling; electrical characteristics; electrical contacts; electrical properties; electron microscopy; energy conversion; foils; high temperature material characterization; high temperature stability; high temperature stable contacts; high temperature stable ohmic contacts; laser welding; n-type SiC; nonrectifying metal-semiconductor contacts; ohmic contacts; oxidation; oxidation protective layers; semiconductor surface; semiconductors; thermal sensor materials; thermal sensors; thermal stability; thermal treatment; thermally stable contacts; thermocouple wires; thermoelectric devices; thermoelectric materials; thermoelectric sensors; thermopower; thin tungsten studs; Ohmic contacts; Optical materials; Semiconductor materials; Silicon carbide; Temperature sensors; Thermal sensors; Thermal stability; Thermoelectricity; Tungsten; Welding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermoelectrics, 2001. Proceedings ICT 2001. XX International Conference on
Conference_Location :
Beijing
ISSN :
1094-2734
Print_ISBN :
0-7803-7205-0
Type :
conf
DOI :
10.1109/ICT.2001.979946
Filename :
979946
Link To Document :
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