Title :
Theory of Spectroscopy and Microscopy with Resonant Radiation Force
Author :
Iida, Takuya ; Ishihara, Hajime
Author_Institution :
Japan Sci. & Technol. Agency, Saitama
Abstract :
This paper explores the potential of spectroscopy and microscopy to observe quantum properties in nanoscale samples by detecting interparticle radiation force (IRF). Results show the availability of IRF to extract multidirectional information of excited nanostructures. This study paves the way to a new type of metrology technique using IRF reflecting many quantum degrees of freedom in excited nanostructures.
Keywords :
atomic force microscopy; excited states; nanostructured materials; quantum optics; spectroscopy; excited nanostructures; interparticle radiation force; metrology technique; microscopy; multidirectional information extraction; quantum degrees-of-freedom; quantum properties; resonant radiation force; scanning force microscopy; spectroscopy; Geometry; Nanostructures; Optical coupling; Optical sensors; Polarization; Probes; Radio frequency; Resonance; Scanning electron microscopy; Spectroscopy;
Conference_Titel :
Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-0931-0
Electronic_ISBN :
978-1-4244-0931-0
DOI :
10.1109/CLEOE-IQEC.2007.4387024
