DocumentCode
2176768
Title
Theory of Spectroscopy and Microscopy with Resonant Radiation Force
Author
Iida, Takuya ; Ishihara, Hajime
Author_Institution
Japan Sci. & Technol. Agency, Saitama
fYear
2007
fDate
17-22 June 2007
Firstpage
1
Lastpage
1
Abstract
This paper explores the potential of spectroscopy and microscopy to observe quantum properties in nanoscale samples by detecting interparticle radiation force (IRF). Results show the availability of IRF to extract multidirectional information of excited nanostructures. This study paves the way to a new type of metrology technique using IRF reflecting many quantum degrees of freedom in excited nanostructures.
Keywords
atomic force microscopy; excited states; nanostructured materials; quantum optics; spectroscopy; excited nanostructures; interparticle radiation force; metrology technique; microscopy; multidirectional information extraction; quantum degrees-of-freedom; quantum properties; resonant radiation force; scanning force microscopy; spectroscopy; Geometry; Nanostructures; Optical coupling; Optical sensors; Polarization; Probes; Radio frequency; Resonance; Scanning electron microscopy; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on
Conference_Location
Munich
Print_ISBN
978-1-4244-0931-0
Electronic_ISBN
978-1-4244-0931-0
Type
conf
DOI
10.1109/CLEOE-IQEC.2007.4387024
Filename
4387024
Link To Document