DocumentCode :
2176935
Title :
Reliability analysis in model-driven development of embedded systems
Author :
Velasco, D.S. ; Kuhn, Thomas ; Kemmann, Soeren
Author_Institution :
Fraunhofer Inst. for Exp. Software Eng., Kaiserslautern, Germany
fYear :
2013
fDate :
28-31 Jan. 2013
Firstpage :
1
Lastpage :
7
Abstract :
Numerous techniques for modeling reliability aspects are applicable in research and industry. However, reliability models are often specialized artifacts; they are created once by specialists and then tend to remain unmaintained, yielding outdated and inaccurate models after short periods of time. This degradation of reliability models can be prevented by integrating them with design models, which improves their visibility to developers and keeps them consistent with other artifacts. Our UML-based approach presented in this paper supports this by enabling integrated modeling of reliability aspects and other, e.g. functional and physical aspects of systems under development. This is achieved by extending the UML through profiles that support the modeling of reliability aspects. We present a notation for the modeling of functions and function networks in combination with Dynamic Reliability Block Diagrams (DRBDs). DRBDs extend standard reliability block diagrams with the possibility of modeling dynamic behaviors and dependencies. Integration of these aspects into a model-driven approach improves model traceability and consistency, and enables integrated reliability modeling.
Keywords :
Unified Modeling Language; embedded systems; software reliability; DRBD; UML-based approach; dependency modelling; design models; dynamic behavior modelling; dynamic reliability block diagrams; embedded systems; function modelling; function networks; model-driven approach; model-driven development; reliability analysis; reliability aspect modelling; Analytical models; Context; Embedded systems; Load modeling; Pumps; Reliability; Unified modeling language; DRBD; Model-driven development; functional dependencies; system design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
Conference_Location :
Orlando, FL
ISSN :
0149-144X
Print_ISBN :
978-1-4673-4709-9
Type :
conf
DOI :
10.1109/RAMS.2013.6517638
Filename :
6517638
Link To Document :
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