DocumentCode :
2176978
Title :
Reliability modeling of wireless sensors
Author :
Chaonan Wang ; Liudong Xing ; Vokkarane, Vinod M. ; Yan Sun
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Massachusetts (UMass) - Dartmouth, Dartmouth, MA, USA
fYear :
2013
fDate :
28-31 Jan. 2013
Firstpage :
1
Lastpage :
6
Abstract :
The accuracy of system reliability analysis depends on realistic estimation of failure parameters at the component-level. This paper models the reliability of wireless sensor nodes under three different scenarios, contributing toward reliability analysis of wireless sensor network systems. Under Scenario 1, a sensor node is kept activated and consumes constant energy throughout its lifetime. Under Scenario 2, a sensor node alternates between two modes: sleep mode and active mode. The duration of each mode is fixed. It consumes less power during the sleep mode than during the active mode. Under Scenario 3, a sensor node also alternates between sleep and active modes but the duration of each mode is not fixed. In particular, the duration of the active mode is bounded and follows a certain distribution. However, the time to activate the sensor node is fixed. Numerical example results show that sensor node working under Scenario 3 is the most reliable and offers longest lifetime among the three scenarios while Scenario 1 is the least reliable one.
Keywords :
parameter estimation; telecommunication network reliability; wireless sensor networks; active mode; failure parameter estimation; reliability modeling; sleep mode; system reliability analysis; wireless sensor networks; Batteries; Capacitive sensors; IEEE 802.16 Standards; Nickel; Reliability; Wireless sensor networks; reliability; sensor node; wireless sensor network;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
Conference_Location :
Orlando, FL
ISSN :
0149-144X
Print_ISBN :
978-1-4673-4709-9
Type :
conf
DOI :
10.1109/RAMS.2013.6517640
Filename :
6517640
Link To Document :
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