• DocumentCode
    2176978
  • Title

    Reliability modeling of wireless sensors

  • Author

    Chaonan Wang ; Liudong Xing ; Vokkarane, Vinod M. ; Yan Sun

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Massachusetts (UMass) - Dartmouth, Dartmouth, MA, USA
  • fYear
    2013
  • fDate
    28-31 Jan. 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The accuracy of system reliability analysis depends on realistic estimation of failure parameters at the component-level. This paper models the reliability of wireless sensor nodes under three different scenarios, contributing toward reliability analysis of wireless sensor network systems. Under Scenario 1, a sensor node is kept activated and consumes constant energy throughout its lifetime. Under Scenario 2, a sensor node alternates between two modes: sleep mode and active mode. The duration of each mode is fixed. It consumes less power during the sleep mode than during the active mode. Under Scenario 3, a sensor node also alternates between sleep and active modes but the duration of each mode is not fixed. In particular, the duration of the active mode is bounded and follows a certain distribution. However, the time to activate the sensor node is fixed. Numerical example results show that sensor node working under Scenario 3 is the most reliable and offers longest lifetime among the three scenarios while Scenario 1 is the least reliable one.
  • Keywords
    parameter estimation; telecommunication network reliability; wireless sensor networks; active mode; failure parameter estimation; reliability modeling; sleep mode; system reliability analysis; wireless sensor networks; Batteries; Capacitive sensors; IEEE 802.16 Standards; Nickel; Reliability; Wireless sensor networks; reliability; sensor node; wireless sensor network;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
  • Conference_Location
    Orlando, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4673-4709-9
  • Type

    conf

  • DOI
    10.1109/RAMS.2013.6517640
  • Filename
    6517640