DocumentCode :
2176992
Title :
Partial discharge patterns and degradation diagnosis in polyethylene and polyimide
Author :
Ichikawa, H. ; Ito, K. ; Suzuoki, Y. ; Mizutani, T. ; Uchida, K.
Author_Institution :
Dept. of Electr. Eng., Nagoya Univ., Japan
Volume :
2
fYear :
1994
fDate :
3-8 Jul 1994
Firstpage :
630
Abstract :
The temporal change of partial discharge (PD) pattern (φ-q-n pattern) was measured up to breakdown for both polyimide (PI) and low-density polyethylene (PE) films with CIGRE Method-II electrode system by using a prototype computer-aided PD measurement and expert system. As a result, the amount of adsorbed water, the humidity and the gas constituent in the gap proved to heavily affect the temporal change of PD patterns. It was suggested that these results were interpreted in terms of the electron attachment-detachment process of both oxygen and moisture, which led to an increase of the discharge time lag. The frequency acceleration by a factor of 3 proved that the temporal change of PD patterns was invariable under certain conditions
Keywords :
automatic test equipment; automatic testing; electric breakdown; expert systems; insulation testing; partial discharges; polyethylene insulation; polymer films; power engineering computing; LDPE; adsorbed water; computer-aided PD measurement; degradation diagnosis; discharge time lag; electrical insulation; electron attachment-detachment process; expert system; frequency acceleration; gas constituent; humidity; partial discharge patterns; polyethylene; polyimide; temporal change; Degradation; Diagnostic expert systems; Electric breakdown; Electrodes; Partial discharge measurement; Partial discharges; Plastic films; Polyethylene; Polyimides; Prototypes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 1994., Proceedings of the 4th International Conference on
Conference_Location :
Brisbane, Qld.
Print_ISBN :
0-7803-1307-0
Type :
conf
DOI :
10.1109/ICPADM.1994.414089
Filename :
414089
Link To Document :
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