Title :
Exploiting narrow-width values for thermal-aware register file designs
Author :
Wang, Shuai ; Hu, Jie ; Ziavras, Sotirios G. ; Chung, Sung Woo
Author_Institution :
Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ
Abstract :
Localized heating-up creates thermal hotspots across the chip, with the integer register file ranked as the hottest unit in high-performance microprocessors. In this paper, we perform a detailed study on the thermal behavior of a low-power value-aware register file (VARF) that is subjected to internal fine-grain hotspots. To further optimize its thermal behavior, we propose and evaluate three thermal-aware control schemes, thermal sensor (TS), access counter (AC), and register-id (ID) based, to balance the access activity and thus the temperature across different partitions in the VARF. The simulation results using SPEC CINT2000 benchmarks show that the register-id controlled VARF (ID-VARF) scheme achieves optimized thermal behavior at minimum cost as compared to the other schemes. We further evaluate the performance impact of the thermal-aware VARF design with the dynamic thermal management (DTM). The experimental results show that the ID-VARF can improve the performance by 26.1% and 7.2% over the conventional register file and the original VARF design, respectively.
Keywords :
microprocessor chips; thermal management (packaging); access counter; dynamic thermal management; fine grain hotspot; high performance microprocessor; integer register file; low power value aware register file; narrow width value; thermal aware control; thermal aware register file design; thermal sensor; Counting circuits; Design optimization; Energy consumption; Microprocessors; Registers; Temperature control; Temperature sensors; Thermal engineering; Thermal management; Thermal sensors;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location :
Nice
Print_ISBN :
978-1-4244-3781-8
DOI :
10.1109/DATE.2009.5090887