• DocumentCode
    2177472
  • Title

    Reliability design of POS temperature circuit based on FTA

  • Author

    Xiangdong, Li ; Maiying, Zhong

  • Author_Institution
    Sch. of Instrum. Sci. & Opto-Electron. Eng., Beihang Univ., Beijing, China
  • fYear
    2011
  • fDate
    9-11 Sept. 2011
  • Firstpage
    2217
  • Lastpage
    2221
  • Abstract
    High precision Position and Orientation System (POS) is important equipment in the airborne remote sensing field. However, the precision of POS is easily affected by temperature. Then it is fairly important to measure temperature information with high reliability and high precision. Aiming at this request, brought up by POS temperature measurement circuit, Fault Tree Analysis (FTA) will be introduced as the core of the analysis and design process. In order to establish the fault tree during the qualitative analysis, “data acquired being faulty” is chosen as the top event. Based on the minimal cut sets concluded from FTA, reliability design, using relevant approaches is implemented to enhance the reliability of the circuit. The reliability prediction of the circuit shows that MTBF improves for more than 10 times, which demonstrates the feasibility and efficiency of FTA and the reliability design. The quantitative analysis of the fault tree calculates the fault probability and probabilistic importance of the minimal cut sets, which provides important information for the fault detection and circuit test. Finally, the result of the constant temperature test of 20°C demonstrates the high reliability and high precision of POS temperature measurement circuit.
  • Keywords
    digital circuits; fault trees; network synthesis; probability; reliability; POS temperature measurement circuit; circuit test; fault detection; fault probability; fault tree analysis; orientation system; position system; reliability design; temperature 20 degC; Circuit faults; Fault trees; Integrated circuit reliability; Reliability engineering; Temperature measurement; Temperature sensors; FTA; minimal cut sets; probabilistic importance; reliability design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Communications and Control (ICECC), 2011 International Conference on
  • Conference_Location
    Ningbo
  • Print_ISBN
    978-1-4577-0320-1
  • Type

    conf

  • DOI
    10.1109/ICECC.2011.6066621
  • Filename
    6066621