DocumentCode
2177726
Title
Correct-by-construction generation of device drivers based on RTL testbenches
Author
Bombieri, Nicola ; Fummi, Franco ; Pravadelli, Graziano ; Vinco, Sara
Author_Institution
Dipt. di Inf., Univ. di Verona, Verona
fYear
2009
fDate
20-24 April 2009
Firstpage
1500
Lastpage
1505
Abstract
The generation of device drivers is a very time consuming and error prone activity. All the strategies proposed up to now to simplify this operation require a manual, even formal, specification of the device driver functionalities. In the system-level design, IP functionalities are tested by using testbenches, implemented to contain the communication protocols to correctly interact with the device. The aim of this paper is to present a methodology to automatically generate device drivers from the testbench of any RTL IP. The only manual step required is to tag the states corresponding to the different device functionalities. The Extended Finite State Machines (EFSMs) are then used to create a correct-by-construction two-level device driver: the lower level deals with architectural choices, while the higher one is derived from the EFSMs and it implements the communication protocols. The effectiveness of this methodology has been proved by applying it to a platform provided by STMicroelectronics.
Keywords
driver circuits; embedded systems; IP functionalities; RTL testbenches; correct-by-construction generation; device drivers; error prone activity; extended finite state machines; system-level design; Access protocols; Automata; Automatic testing; Design engineering; Embedded system; Error correction; Manuals; Object oriented modeling; System testing; System-level design;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location
Nice
ISSN
1530-1591
Print_ISBN
978-1-4244-3781-8
Type
conf
DOI
10.1109/DATE.2009.5090900
Filename
5090900
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