DocumentCode
2178026
Title
Passive and Active Combined Attacks on AES Combining Fault Attacks and Side Channel Analysis
Author
Clavier, Christophe ; Feix, Benoit ; Gagnerot, Georges ; Roussellet, Mylène
Author_Institution
Inst. d´´Ing. Inf. de Limoges (3IL), Univ. de Limoges XLIM, Limoges, France
fYear
2010
fDate
21-21 Aug. 2010
Firstpage
10
Lastpage
19
Abstract
Tamper resistance of hardware products is currently a very popular subject for researchers in the security domain. Since the first Kocher side-channel (passive)attack, the Bellcore researchers and Biham and Shamir fault (active) attacks, many other side-channel and fault attacks have been published. The design of efficient countermeasures still remains a difficult task for IC designers and manufacturers as they must also consider the attacks which combine active and passive threats. It has been shown previously that combined attacks can defeat RSA implementations if side-channel countermeasures and fault protections are developed separately instead of being designed together. This paper demonstrates that combined attacks are also effective on symmetric cryptosystems and shows how they may jeopardize a supposedly state of the art secure AES implementation.
Keywords
cryptography; fault diagnosis; integrated circuit design; integrated circuit manufacture; AES; Bellcore researchers; Biham fault attacks; Kocher side-channel; RSA implementations; Shamir fault attacks; active combined attacks; advanced encryption standards; fault protections; hardware products; integrated circuit designers; integrated circuit manufacturers; passive combined attacks; security domain; side channel analysis; side-channel countermeasures; symmetric cryptosystems; tamper resistance; Analytical models; Correlation; Cryptography; Doped fiber amplifiers; Microprocessors; Power demand; Resistance; Advanced Encryption Standard; Collision Fault Analysis; Correlation Side Channel Analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Fault Diagnosis and Tolerance in Cryptography (FDTC), 2010 Workshop on
Conference_Location
Santa Barbara, CA
Print_ISBN
978-1-4244-7844-6
Type
conf
DOI
10.1109/FDTC.2010.17
Filename
5577362
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