DocumentCode
2178146
Title
New Method to Solve the End Effect of Empirical Mode Decomposition
Author
Zhang Leitao ; Chen Huanguo ; Li Jianmin ; Chen Wenhua
Author_Institution
Sch. of Mech. & Autom. Control, Zhejiang Sci-Tech Univ., Hangzhou, China
fYear
2009
fDate
17-19 Oct. 2009
Firstpage
1
Lastpage
5
Abstract
The end sifting method has been proposed to solve the end effect problem of empirical mode decomposition (EMD). During the intrinsic mode function (IMF) sifting process by EMD method, a procedure including end effect judgment and end sifting, which is different from the traditional idea dealing with the problem by dictating or predicting an end point, is added. This method has greatly improved the precision of IMF.
Keywords
signal processing; time-domain analysis; IMF; empirical mode decomposition; end effect judgment; end sifting method; intrinsic mode function sifting process; Automatic control; Automation; Circuits; Frequency; Hilbert space; Mirrors; NASA; Neural networks; Signal processing; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Image and Signal Processing, 2009. CISP '09. 2nd International Congress on
Conference_Location
Tianjin
Print_ISBN
978-1-4244-4129-7
Electronic_ISBN
978-1-4244-4131-0
Type
conf
DOI
10.1109/CISP.2009.5304936
Filename
5304936
Link To Document