DocumentCode
2178208
Title
A high speed high resolution readout with 14-bits area efficient SAR-ADC adapted for new generations of CMOS image sensors
Author
Ben Aziza, Sassi ; Dzahini, Daniel ; Gallin-Martel, Laurent
Author_Institution
STMicroelectronics, LPSC Laboratory, 12 rue Jules Horowitz, 38000 Grenoble, France, 53, rue des Martyrs 38026 Grenoble France
fYear
2015
fDate
June 29 2015-July 2 2015
Firstpage
89
Lastpage
92
Abstract
In this paper, a high speed high resolution readout design for CMOS image sensors is presented. It has been optimized to fit within a 7.5um pitch under a 0.28um 1P3M process. The readout design ensures one conversion in only 1.5us and targets a DNL feature about +0.9/−0.7 over 14-bits. Noise performances have been optimized as well to ensure an 84dB dynamic range image sensor. Along with the designing phase, image quality has been considered and corrected by means of analog and digital correlated-double-sampling (CDS) operations. Compactness of the design has been assured through a specific architecture of the analog-to-digital converter (ADC) making it compatible with fine pixel pitch design.
Keywords
CMOS image sensors; Capacitors; Decoding; Dynamic range; Electronics packaging; Image resolution; Noise; CDS; Column-parallel architecture; High speed operation; Low power low noise design; Successive-Approximation-Register ADC; high dynamic range;
fLanguage
English
Publisher
ieee
Conference_Titel
Ph.D. Research in Microelectronics and Electronics (PRIME), 2015 11th Conference on
Conference_Location
Glasgow, United Kingdom
Type
conf
DOI
10.1109/PRIME.2015.7251341
Filename
7251341
Link To Document