• DocumentCode
    2178208
  • Title

    A high speed high resolution readout with 14-bits area efficient SAR-ADC adapted for new generations of CMOS image sensors

  • Author

    Ben Aziza, Sassi ; Dzahini, Daniel ; Gallin-Martel, Laurent

  • Author_Institution
    STMicroelectronics, LPSC Laboratory, 12 rue Jules Horowitz, 38000 Grenoble, France, 53, rue des Martyrs 38026 Grenoble France
  • fYear
    2015
  • fDate
    June 29 2015-July 2 2015
  • Firstpage
    89
  • Lastpage
    92
  • Abstract
    In this paper, a high speed high resolution readout design for CMOS image sensors is presented. It has been optimized to fit within a 7.5um pitch under a 0.28um 1P3M process. The readout design ensures one conversion in only 1.5us and targets a DNL feature about +0.9/−0.7 over 14-bits. Noise performances have been optimized as well to ensure an 84dB dynamic range image sensor. Along with the designing phase, image quality has been considered and corrected by means of analog and digital correlated-double-sampling (CDS) operations. Compactness of the design has been assured through a specific architecture of the analog-to-digital converter (ADC) making it compatible with fine pixel pitch design.
  • Keywords
    CMOS image sensors; Capacitors; Decoding; Dynamic range; Electronics packaging; Image resolution; Noise; CDS; Column-parallel architecture; High speed operation; Low power low noise design; Successive-Approximation-Register ADC; high dynamic range;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ph.D. Research in Microelectronics and Electronics (PRIME), 2015 11th Conference on
  • Conference_Location
    Glasgow, United Kingdom
  • Type

    conf

  • DOI
    10.1109/PRIME.2015.7251341
  • Filename
    7251341