• DocumentCode
    2178226
  • Title

    An efficient path-oriented bitvector encoding width computation algorithm for bit-precise verification

  • Author

    He, Nannan ; Hsiao, Michael S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Virginia Tech Blacksburg, Blacksburg, VA
  • fYear
    2009
  • fDate
    20-24 April 2009
  • Firstpage
    1602
  • Lastpage
    1607
  • Abstract
    Bit-precise verification with variables modeled as bitvectors has recently drawn much interest. However, a huge search space usually results after bit-blasting. To accelerate the verification of bit-vector formulae, we propose an efficient algorithm to discover non-uniform encoding widths. We of variables in the verification model, which may be smaller than their original modeling widths but sufficient to find a counterexample. Different from existing approaches, our algorithm is path-oriented, in that it takes advantage of the controllability and observability values in the structure of the model to guide the computation of the paths, their encoding widths and the effective adjustment of these widths in subsequent steps. For path selection, a subset of single-bit path-controlling variables is set to constant values. This can restrict the search from those paths deemed less favorable or have been checked in previous steps, thus simplifying the problem. Experiments show that our algorithm can significantly speed up the search by focusing first on those promising, easy paths for verifying those path-intensive models, with reduced, non-uniform bitwidth encoding.
  • Keywords
    Boolean algebra; formal verification; bit-blasting; bit-precise verification; controllability; nonuniform bitwidth encoding; observability; path selection; path-intensive model; path-oriented bitvector encoding width computation; single-bit path-controlling variable; Acceleration; Controllability; Data analysis; Encoding; Equations; Formal verification; Hardware; Helium; Observability; Scalability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
  • Conference_Location
    Nice
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-3781-8
  • Type

    conf

  • DOI
    10.1109/DATE.2009.5090920
  • Filename
    5090920