Spectral Coherence Interferometry (SCI) for fast and rugged industrial applications

Summary form only given. Standard optical coherence tomography (OCT) has been proven to provide surface and general 3D metrology results, however mostly in applications where acquisition speed is not mandatory and sub-mum accuracy can be compromised like in most medical applications. ISIS sentronics has introduced an alternative method, called spectral coherence interferometry (SCI) which still exploits the advantages of standard OCT but the advantages are: (a) very fast acquisition time and (b) robust for production environment partly because of no moving mirror in the reference arm. All sensor systems comprise a sensor head which optically encodes the distance signal from the sensor head aperture to the object surface within an mini-interferometer and a controller unit to optically decode the signal to convert it into a electrical analog signal from a single photo diode.