• DocumentCode
    2178576
  • Title

    Negative index materials

  • Author

    Soukoulis, Costas M.

  • Author_Institution
    Iowa State Univ., Ames
  • fYear
    2007
  • fDate
    17-22 June 2007
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The possibility of negative refraction has brought about a reconsideration of many fundamental optical and electromagnetic phenomena. This new degree of freedom has provided a tremendous stimulus for the physics, optics and engineering communities to investigate how these new ideas can be utilized. Many interesting and potentially important effects not possible in positive refracting materials, such as near-fieId refocusing and sub-diffraction limited imaging, have been predicted to occur when the refractive index changes sign. In this talk, I will give a historical appraisal of the field and also review our own work on negative refraction in metamaterials, and describe the possible impact of them as new types of optical elements. In particular, I will present theoretical and experimental results on engineered microstructures designed to have both e and mu negative. Results for different polarizations and propagation directions will be presented. Recent results on microstructures operating at 100-200 THz will be also discussed, and the role of losses will be also examined.
  • Keywords
    metamaterials; refractive index; electromagnetic phenomena; engineered microstructures; frequency 100 THz to 200 THz; metamaterials; near-fieId refocusing; negative index materials; negative refraction; optical elements; optical phenomena; polarizations; positive refracting materials; propagation directions; refractive index; sub-diffraction limited imaging; Appraisal; Electromagnetic refraction; Metamaterials; Microstructure; Optical imaging; Optical materials; Optical refraction; Optical variables control; Physics; Refractive index;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on
  • Conference_Location
    Munich
  • Print_ISBN
    978-1-4244-0931-0
  • Electronic_ISBN
    978-1-4244-0931-0
  • Type

    conf

  • DOI
    10.1109/CLEOE-IQEC.2007.4387095
  • Filename
    4387095