Title :
Built-in self-test of bit-serial arithmetic units for digital signal processing
Author :
Kreken, Hans O. ; Aas, Einar J.
Author_Institution :
Fac. of Electr. Eng. & Telecommun., Norwegian Univ. of Sci. & Technol., Tronheim, Norway
Abstract :
Bit-serial multipliers with fixed coefficients are commonly exploited in area efficient DSP applications. Built-In Self-Test is a viable technique for high quality testing. We present and analyze a very area efficient BIST technique based on normal or inverted output-to-input feedback. Testing is employed at system speed
Keywords :
built-in self test; circuit feedback; digital arithmetic; digital signal processing chips; fault diagnosis; area efficient DSP applications; bit-serial arithmetic units; built-in self-test; digital signal processing; fixed coefficients; high quality testing; inverted output-to-input feedback; Adders; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Digital arithmetic; Digital signal processing; Hardware; Output feedback; Scanning probe microscopy;
Conference_Titel :
Circuits and Systems, 1997. Proceedings of the 40th Midwest Symposium on
Conference_Location :
Sacramento, CA
Print_ISBN :
0-7803-3694-1
DOI :
10.1109/MWSCAS.1997.666132
