DocumentCode :
2179277
Title :
Stochastic High Order Basis Functions for Volume Integral Equation with Surface Roughness
Author :
Moselhy, Tarek ; Daniel, Luca
Author_Institution :
Massachusetts Inst. of Technol., Cambridge
fYear :
2007
fDate :
29-31 Oct. 2007
Firstpage :
73
Lastpage :
76
Abstract :
In this paper we present stochastic high order basis functions suitable for the volumetric discretization of interconnect structures. The proposed basis functions are wideband, and can easily be integrated within a stochastic magneto-quasistatic (MQS) or a fullwave mixed potential integral equation (MPIE) solver, rendering the stochastic formulation computationally efficient. In addition, our high order basis functions facilitate the calculation of a correction term, improving the accuracy of the impedance ensemble average.
Keywords :
integral equations; integrated circuit interconnections; integrated circuit modelling; stochastic processes; surface resistance; fullwave mixed potential integral equation solver; interconnect structures; stochastic high order basis functions; stochastic magneto-quasistatic solver; surface roughness; volume integral equation; volumetric discretization; Conductors; Current density; Current distribution; Frequency; Integral equations; Rough surfaces; Stochastic processes; Surface roughness; Wideband; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 2007 IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-0883-2
Type :
conf
DOI :
10.1109/EPEP.2007.4387127
Filename :
4387127
Link To Document :
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