• DocumentCode
    2179577
  • Title

    Developing a reliability, availability and maintainability process

  • Author

    Knight, R.T.

  • Author_Institution
    MITRE Corp., Bedford, MA, USA
  • fYear
    2013
  • fDate
    28-31 Jan. 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The Department of Defense (DoD) has put an increased focus on reliability during system acquisition and development. This is due to historically poor reliability performance which has significantly increased sustainment costs for systems that have been built over the last 25 years. The Director of the Department of Operational Test and Evaluation has written a memorandum, dated June 30, 2010 with subject “State of Reliability” discussing these concerns. Training time for a new reliability engineer can be reduced by providing the engineer with a documented process guide for reliability engineering activities. This process guide provides guidance for each reliability task, and relates the task to the DoD acquisition life cycle phase, which enhances the training for new graduates as well as experienced reliability engineers that lack exposure to DoD programs. Maintaining a standard set of modeling and simulation tools produces consistent analytical products and improves the efficiency within the organization by eliminating redundant modeling packages. Documenting the Reliability, Availability and Maintainability (RAM) process in a guide allows the reliability group to provide consistent and sound technical guidance to any DoD project. This process guide also reduces the transition time for RAM Subject Matter Experts (SMEs) when entering a new project that may be in a different phase of the DoD life cycle. The process guide also improves the awareness, at the program level, of the RAM efforts that are required to ensure reliability is integrated into product development.
  • Keywords
    defence industry; maintenance engineering; product development; reliability; Department of Defense; Department of Operational Test and Evaluation; DoD acquisition life cycle phase; RAM process; availability process; maintainability process; product development; reliability engineer; reliability performance; reliability process; reliability task; system acquisition; system development; Manufacturing; Production; Random access memory; Reliability engineering; Stress; US Department of Defense; Availability; DoD; Maintainability; Process; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
  • Conference_Location
    Orlando, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4673-4709-9
  • Type

    conf

  • DOI
    10.1109/RAMS.2013.6517730
  • Filename
    6517730