DocumentCode :
2179774
Title :
Competing failure modes modeling with limited wearout failures
Author :
Peng Liu ; Peng Wang
Author_Institution :
JMP Div., SAS Inst. Inc., Cary, NC, USA
fYear :
2013
fDate :
28-31 Jan. 2013
Firstpage :
1
Lastpage :
6
Abstract :
This paper proposes a new modeling approach which can be applied to solve some practical reliability engineering problems when competing failure modes present, but only one or limited failures have occurred. This type of failure data cannot be modeled by traditional time-to-failure distributions. The new approach is derived from Weibayes method and provides a viable solution when reliability inference is needed during early product deployment phase. The most important value of the derivation is: it provides a distributional interpretation about the Weibayes result, and the assumptions that are made. The derivation not only reproduces the important result in the literature, but also gives insight into the sampling distribution of the parameter estimate. A parametric bootstrap method is used to illustrate how to incorporate the result in competing failure mode modeling.
Keywords :
Bayes methods; failure analysis; parameter estimation; reliability; sampling methods; statistical distributions; Weibayes method; competing failure modes modeling; failure data; limited wearout failure; parameter estimate; parametric bootstrap method; product deployment phase; reliability engineering problem; reliability inference; sampling distribution; Bayes methods; Data models; Maximum likelihood estimation; Reliability engineering; Suspensions; Synthetic aperture sonar; Bayesian; Failure Mode; Reliability; Wearout; Weibayes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
Conference_Location :
Orlando, FL
ISSN :
0149-144X
Print_ISBN :
978-1-4673-4709-9
Type :
conf
DOI :
10.1109/RAMS.2013.6517738
Filename :
6517738
Link To Document :
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