Title :
Prognostics for electronic components
Author_Institution :
SoHaR Inc., Culver City, CA, USA
Abstract :
The paper emphasizes prognostics that are derived from data currently available within or from electronic components, thus avoiding the need for additional sensors and extensive physical modification of systems and permitting immediate savings to be realized. Areas where this approach is particularly suitable include: semiconductor memories; data communications; initialization procedures; and feedback control loops. The melding of the empirical methodology addressed here with the more comprehensive physics of failure based approach is anticipated.
Keywords :
condition monitoring; electronics industry; reliability; data communication; electronic component; failure based approach; feedback control loop; initialization procedure; prognostics; semiconductor memories; Electronic components; Feedback control; Maintenance engineering; Monitoring; Random access memory; Reliability; Sensors; Effects based prognostics; empirical prognostics; error detection; feedback control;
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4673-4709-9
DOI :
10.1109/RAMS.2013.6517743
