DocumentCode
2179935
Title
Prognostics for electronic components
Author
Hecht, H.
Author_Institution
SoHaR Inc., Culver City, CA, USA
fYear
2013
fDate
28-31 Jan. 2013
Firstpage
1
Lastpage
4
Abstract
The paper emphasizes prognostics that are derived from data currently available within or from electronic components, thus avoiding the need for additional sensors and extensive physical modification of systems and permitting immediate savings to be realized. Areas where this approach is particularly suitable include: semiconductor memories; data communications; initialization procedures; and feedback control loops. The melding of the empirical methodology addressed here with the more comprehensive physics of failure based approach is anticipated.
Keywords
condition monitoring; electronics industry; reliability; data communication; electronic component; failure based approach; feedback control loop; initialization procedure; prognostics; semiconductor memories; Electronic components; Feedback control; Maintenance engineering; Monitoring; Random access memory; Reliability; Sensors; Effects based prognostics; empirical prognostics; error detection; feedback control;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
Conference_Location
Orlando, FL
ISSN
0149-144X
Print_ISBN
978-1-4673-4709-9
Type
conf
DOI
10.1109/RAMS.2013.6517743
Filename
6517743
Link To Document