DocumentCode :
2179935
Title :
Prognostics for electronic components
Author :
Hecht, H.
Author_Institution :
SoHaR Inc., Culver City, CA, USA
fYear :
2013
fDate :
28-31 Jan. 2013
Firstpage :
1
Lastpage :
4
Abstract :
The paper emphasizes prognostics that are derived from data currently available within or from electronic components, thus avoiding the need for additional sensors and extensive physical modification of systems and permitting immediate savings to be realized. Areas where this approach is particularly suitable include: semiconductor memories; data communications; initialization procedures; and feedback control loops. The melding of the empirical methodology addressed here with the more comprehensive physics of failure based approach is anticipated.
Keywords :
condition monitoring; electronics industry; reliability; data communication; electronic component; failure based approach; feedback control loop; initialization procedure; prognostics; semiconductor memories; Electronic components; Feedback control; Maintenance engineering; Monitoring; Random access memory; Reliability; Sensors; Effects based prognostics; empirical prognostics; error detection; feedback control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
Conference_Location :
Orlando, FL
ISSN :
0149-144X
Print_ISBN :
978-1-4673-4709-9
Type :
conf
DOI :
10.1109/RAMS.2013.6517743
Filename :
6517743
Link To Document :
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