• DocumentCode
    2180574
  • Title

    Optimizing test confidence based on life cycle cost

  • Author

    Bindel, S.R.

  • Author_Institution
    U.S. Army Test & Evaluation Command, Aberdeen Proving Ground, MD, USA
  • fYear
    2013
  • fDate
    28-31 Jan. 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Current Army acquisition policy states that systems shall demonstrate reliability requirements with high confidence, but the policy fails to state what `high´ confidence means. Despite this, for every system there is an optimal confidence level with which to demonstrate the reliability requirement. The optimal confidence level may be driven by many competing factors including cost, schedule, Soldier safety, and mission criticality. Most of these factors are difficult to quantify, and leave the community to make a judgment call on the appropriate confidence level. In the absence of other driving or quantifiable metrics, one way to choose an optimal confidence level is to balance test cost against the risk to life cycle cost. This method deals in a natural metric: money. It is easily understood by the layman, and is straightforward to compare to most other programmatic risks. Conveniently it provides objective support for the common sense solution that inexpensive systems (to buy and test) that will be purchased in large quantities should be tested at higher confidence, while expensive systems (to buy and test) bought in low quantities possibly should be tested at lower confidence. If the other factors are not overwhelming, or do not suggest a particular confidence level, confidence can be optimized by balancing test cost against life cycle cost.
  • Keywords
    life cycle costing; military systems; reliability; army acquisition policy; inexpensive system; life cycle cost; mission criticality; optimal confidence level; programmatic risk; quantifiable metrics; reliability requirements; soldier safety; test confidence optimization; test cost balancing; Communities; Maintenance engineering; Mathematical model; Measurement; Reliability; Safety; Testing; LCC; Life cycle cost; O&S cost; RAM; reliability; requirements development; test confidence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
  • Conference_Location
    Orlando, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4673-4709-9
  • Type

    conf

  • DOI
    10.1109/RAMS.2013.6517768
  • Filename
    6517768