Title :
Statistical performance guarantees in large-scale cross-path packet switch
Author :
Chan, M.C. ; Lee, Tony T. ; Liew, Soung Y.
Author_Institution :
Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Shatin, China
Abstract :
Recently, a quasi-static routing scheme called path switching was proposed for large-scale packet switch systems. The path-switched Clos network is called a cross-path switch. The cross-path switch is capable of supporting multirate and multicast traffic. In this paper, we develop a general framework for it to handle multimedia traffic. We study the statistical behavior of the cross-path switch using exponential bounded burstiness (EBB) processes as source session traffic models. With characterizing the service guarantees by service curves, we derive a set of statistical bounds on the delay, backlog and departure processes at the switch on a per-session basis. These bounds are necessary for providing per-session statistical quality of service (QoS) guarantees in the cross-path switch and achieving high system utilization
Keywords :
delays; large-scale systems; multicast communication; multistage interconnection networks; packet switching; quality of service; statistical analysis; telecommunication congestion control; telecommunication network routing; telecommunication traffic; QoS guarantees; backlog; call admission control; delay; departure process; exponential bounded burstiness process; high system utilization; large-scale cross-path packet switch; large-scale packet switch systems; multicast traffic; multimedia traffic; multirate traffic; path switching; path-switched Clos network; per-session statistical quality of service; service curves; service guarantees; source session traffic models; statistical behavior; statistical bounds; statistical performance guarantees; Communication networks; Communication switching; Delay; Large-scale systems; Packet switching; Quality of service; Routing; Switches; Telecommunication traffic; Traffic control;
Conference_Titel :
Communications, 2000. ICC 2000. 2000 IEEE International Conference on
Conference_Location :
New Orleans, LA
Print_ISBN :
0-7803-6283-7
DOI :
10.1109/ICC.2000.853794