Title :
A Rapid Link Analysis Technique Using Four-Port Scattering Parameters
Author :
McCoy, Bart ; Coker, Jonathan ; Techentin, Robert ; Gilbert, Bany ; Daniel, Erik
Author_Institution :
Mayo Clinic, Rochester
Abstract :
A rapid link analysis technique is presented which simulates link performance using 4-port S-parameter models and pseudorandom driver stimulus. The mathematical technique and validation through simulation and hardware measurements of eye diagrams are presented.
Keywords :
S-parameters; network analysis; 4-port S-parameter models; eye diagrams; four-port scattering parameters; pseudorandom driver stimulus; rapid link analysis technique; Algorithm design and analysis; Analytical models; Circuit simulation; Convolution; Discrete Fourier transforms; Frequency domain analysis; Frequency measurement; Mathematical model; Scattering parameters; Testing;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2007 IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-0883-2
DOI :
10.1109/EPEP.2007.4387188
