DocumentCode :
2181111
Title :
System level Validation of Improved IO Buffer Behavioral Modeling Methodology Based on IBIS
Author :
Varma, Ambrish ; Steer, Michael ; Franzon, Paul
Author_Institution :
NCSU, Raleigh
fYear :
2007
fDate :
29-31 Oct. 2007
Firstpage :
351
Lastpage :
354
Abstract :
System level simulation and validation of a new macromodeling methodology based on IBIS (Input/Output Buffer Information Specification) models is presented. Enhancements of the black-box techniques discussed in [1] are discussed. The proposed macromodel is circuit based and can be customized by model makers or users. The new macromodel produces models that can be simulated accurately for Simultaneous Switching Noise (SSN). To demonstrate the solution, a CMOS voltage-mode driver circuit and a MICRON DDR2 driver are simulated using real life package models and compared with equivalent circuits created with IBIS models of the same drivers.
Keywords :
CMOS memory circuits; buffer circuits; buffer storage; CMOS voltage-mode driver circuit; MICRON DDR2 driver; black-box technique; buffer behavioral modeling; complementary metal-oxide-semiconductor; input/output buffer information specification model; macromodeling; simultaneous switching noise; system level simulation; system level validation; Circuit noise; Circuit simulation; Current supplies; Driver circuits; Error correction; Packaging; Power system modeling; Semiconductor device modeling; Sun; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 2007 IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-0883-2
Type :
conf
DOI :
10.1109/EPEP.2007.4387200
Filename :
4387200
Link To Document :
بازگشت