• DocumentCode
    2181111
  • Title

    System level Validation of Improved IO Buffer Behavioral Modeling Methodology Based on IBIS

  • Author

    Varma, Ambrish ; Steer, Michael ; Franzon, Paul

  • Author_Institution
    NCSU, Raleigh
  • fYear
    2007
  • fDate
    29-31 Oct. 2007
  • Firstpage
    351
  • Lastpage
    354
  • Abstract
    System level simulation and validation of a new macromodeling methodology based on IBIS (Input/Output Buffer Information Specification) models is presented. Enhancements of the black-box techniques discussed in [1] are discussed. The proposed macromodel is circuit based and can be customized by model makers or users. The new macromodel produces models that can be simulated accurately for Simultaneous Switching Noise (SSN). To demonstrate the solution, a CMOS voltage-mode driver circuit and a MICRON DDR2 driver are simulated using real life package models and compared with equivalent circuits created with IBIS models of the same drivers.
  • Keywords
    CMOS memory circuits; buffer circuits; buffer storage; CMOS voltage-mode driver circuit; MICRON DDR2 driver; black-box technique; buffer behavioral modeling; complementary metal-oxide-semiconductor; input/output buffer information specification model; macromodeling; simultaneous switching noise; system level simulation; system level validation; Circuit noise; Circuit simulation; Current supplies; Driver circuits; Error correction; Packaging; Power system modeling; Semiconductor device modeling; Sun; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 2007 IEEE
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    978-1-4244-0883-2
  • Type

    conf

  • DOI
    10.1109/EPEP.2007.4387200
  • Filename
    4387200