Effective efficiency measurement results conducted on a X-band thin film waveguide barretter mount developed at NPL, New Delhi

Author

Bhatnagar, H.M. ; Kothari, P.C.

Author_Institution

Nat. Phys. Lab., New Delhi, India

fYear

1994

fDate

June 27 1994-July 1 1994

Firstpage

480

Lastpage

481

Abstract

Effective efficiency measurements have been conducted at 10.0 GHz using a single load microcalorimetric technique on a thin film primary standard waveguide barretter mount designed and fabricated at National Physical Laboratory, New Delhi. The same mount was taken to three National Laboratories, namely NIST, USA; KRISS, Republic of Korea; PTB, Germany for an international comparison of effective efficiency measurements. This paper briefly describes the techniques employed for the measurement of effective efficiency of bolometer mounts by these countries. The results of effective efficiency are reported and intercompared.<>

Keywords

bolometers; calorimetry; measurement standards; microwave measurement; thin film resistors; 10 GHz; Germany; KRISS; Korea; NIST; NPL; National Physical Laboratory; New Delhi; PTB; USA; X-band thin film waveguide barretter mount; bolometer mounts; effective efficiency measurement; international comparison; microcalorimetric technique; primary standard; Bolometers; Copper; Frequency; Laboratories; Measurement standards; NIST; Performance evaluation; Standards development; Thin wall structures; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on

Conference_Location

Boulder, CO, USA

Print_ISBN

0-7803-1984-2

Type

conf

DOI

10.1109/CPEM.1994.333209

Filename

333209