DocumentCode
2182611
Title
Characterization of the InGaAs detector to be used as a radiometric transfer etalon
Author
Dubard, J. ; Gauthier, F. ; Fortas, A.
Author_Institution
Lab. Central des Sci. Electron., Fontenay-Aux-Roses, France
fYear
1994
fDate
June 27 1994-July 1 1994
Firstpage
461
Lastpage
462
Abstract
Large area InGaAs detectors are characterized by spectral sensitivity, spatial uniformity and shunt resistance, in order to determine their abilities to be used as transfer etalons in place of germanium detectors for power measurements in fiber optics field. The paper shows the initial measurements on a 5 mm-diameter InGaAs detector prior to an ageing process which will be monitored with a six months measurement cycling period. The measurements show a kink in the spectral sensitivity curve at 1650 nm, far away from the 1550 nm region, a good spatial uniformity at 850 nm, 1300 nm and 1550 nm, and a shunt resistance of 35 k/spl Omega/ at room temperature.<>
Keywords
III-V semiconductors; electric sensing devices; gallium arsenide; indium compounds; infrared detectors; measurement standards; optical fibres; power measurement; radiometry; 1300 nm; 1650 nm; 35 kohm; 5 mm; 850 nm; InGaAs; InGaAs detector; InGaAs detectors; ageing; fiber optics field; power measurement; radiometric transfer etalon; shunt resistance; spatial uniformity; spectral sensitivity; transfer etalons; Aging; Detectors; Electrical resistance measurement; Germanium; Indium gallium arsenide; Monitoring; Optical fibers; Power measurement; Radiometry; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location
Boulder, CO, USA
Print_ISBN
0-7803-1984-2
Type
conf
DOI
10.1109/CPEM.1994.333219
Filename
333219
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