A new optical wavelength ratio measurement apparatus: the fringe counting sigmameter

Author

Juncar, P. ; Elandaloussi, H. ; Himbert, M. ; Pinard, J. ; Razet, K.

Author_Institution

Inst. Nat. de Metrol., CNRS, Paris, France

fYear

1994

fDate

June 27 1994-July 1 1994

Firstpage

457

Lastpage

458

Abstract

A new compact and achromatic Michelson-type interferometer with a variable path difference is presented. This "fringe-counting sigmameter" allows one to measure optical wavelength ratios between two radiations emitted by stabilized lasers. Maintained in vacuum, this apparatus can determine wavelength/frequency laser radiation from 0.36 /spl mu/m to 1.5 /spl mu/m with a relative accuracy of 5.10/sup -9/, with the use of a reference stabilized He-Ne laser.<>

Keywords

frequency measurement; gas lasers; helium; laser variables measurement; light interferometers; measurement standards; neon; 0.36 to 1.5 mum; He-Ne; achromatic Michelson-type interferometer; data acquisition; fringe counting sigmameter; fringe-counting sigmameter; optical frequency measurement; optical wavelength ratio measurement apparatus; reference stabilized He-Ne laser; relative accuracy; variable path difference; wavelength/frequency laser radiation; Cotton; Laser stability; Optical interferometry; Optical refraction; Optical variables control; Phase detection; Polarization; Position measurement; Stimulated emission; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on

Conference_Location

Boulder, CO, USA

Print_ISBN

0-7803-1984-2

Type

conf

DOI

10.1109/CPEM.1994.333221

Filename

333221