DocumentCode
2182679
Title
Nanoprecision aligned wafer direct bonding and its outlook
Author
Wang, Chenxi ; Suga, Tadatomo
Author_Institution
Sch. of Eng., Univ. of Tokyo, Tokyo, Japan
fYear
2011
fDate
8-11 Aug. 2011
Firstpage
1
Lastpage
4
Abstract
A nanoprecision aligned wafer bonding is presented enabling creating innovative nanostructures. To achieve high-precision wafer bonding, a perfect alignment as well as room-temperature bonding process is necessary. In this paper, the limit of typical alignment methods is addressed firstly and a moire fringe assisted alignment method is developed to breakthrough the limit. Moreover, in order to realize room-temperature bonding without heating, a fluorine containing plasma activation is developed to combine silicon and silicon oxide wafers in air. On the other hand, a process flow consisting of the precise alignment and room-temperature bonding processes with in-situ strategy is demonstrated to realize the nanoprecison aligned wafer bonding. The proposed strategy provides one of possible solutions for development of aligned wafer bonding tools, which will open up opportunities in 3D integration circuits, 3D photonic crystals, and advanced nanotransistors.
Keywords
nanofabrication; photonic crystals; three-dimensional integrated circuits; wafer bonding; 3D integration circuits; 3D photonic crystals; advanced nanotransistors; nanoprecision aligned wafer direct bonding; plasma activation; precise alignment; Bonding; Gratings; Plasma temperature; Silicon; Three dimensional displays; Wafer bonding;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4577-1770-3
Electronic_ISBN
978-1-4577-1768-0
Type
conf
DOI
10.1109/ICEPT.2011.6066807
Filename
6066807
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